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Ultrasonic Thickness Meter, AD-3255 Series
A&D
[Features]
· This product can be used to measure the thickness of a wide range of materials such as metal, glass, plastic, ceramic, epoxy, etc.
· This single unit covers a wide measurement range (0.8 to 300 mm) with a display resolution of 0.01 mm (display can be switched between 0.01 mm and 0.1 mm).
· Includes a scan mode to measure the smallest thickness detected within a wide range.
· 3 types of probes can be used to accommodate different applications.
· Thickness can be measured through a coating* (when using the AD-3255-04, sold separately).
· It is possible to measure the thickness of the object to be measured excluding the thickness of any paint or coating using echo/echo mode.
· Zero point adjustment of probes is supported. Includes 4 mm-equivalent test piece.
· Probes can be replaced.
· Supports sound speed adjustment.
· 1-point adjustment, 2-point adjustment and adjustment via numerical input are supported. Both setting and adjustment data are committed to the device's memory.
· Display of coupling state as well as verification of the contact state are supported.
· Remaining battery power can be displayed.
· When the batteries are exhausted, the battery indicator will flash.
· Equipped with battery-saving auto power off function.
· If the device is not used for approx. 5 minutes, the display will flash for 20 seconds and the power will turn off automatically.
· Backlight function allows easy viewing of values even in dark environments.
* Thickness measurement through a coating can be performed provided that the coating thickness is no greater than 1 mm and the ratio of the coating thickness to the thickness of the object being measured is at least 1:8.
· However, measurement may not be possible depending on the type of coating present and the state of the object being measured.
· Additionally, coating thickness can not be measured.
Product Type | Measuring Range(μm) | Resolution(μm) | Measurement accuracy |
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Film Thickness Gauge | Pulse/echo mode: 0.8 to 200.0 ~ 7 MHz probe: 0.8 to 200.0, 5 MHz probe: 1.0 to 300.0, 2.0 to 300.0, 4.0 to 30.0 (*measured over coating) | - | ±0.1 mm ±0.5% (measurement range: 0.8 to 50.0 mm), ±0.1 mm ±1.5% (measurement range: 50.1 to 300.0 mm) *Measurement and corresponding precision will depend on the state of the surface of the object being measured. |
From: ₹ 6,088.65 |
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Days to Ship: 5 Day(s) or more |
You can add up to 6 items per a category to the compare list.
Electromagnetic Film Thickness Gauge LE-373
KETTKAGAKU
[Features]
· LE-373 is a film thickness gauge that measures the thickness of coatings, platings, etc. (excluding electrolytic nickel plating) on magnetic materials.
· Data can be transferred to a printer or computer; equipped with 16 types of functions, including application memory (calibration curve memory), measured data memory, film thickness management upper/lower limit settings, simple statistical processing, data output, etc.
Product Type | Measuring Range(μm) | Resolution(μm) | Measurement accuracy |
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Film Thickness Gauge | 0~2500 | Less than 100 μm: 0.1 μm, 100 μm or more: 1 μm | - |
From: ₹ 205,318.51 |
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Days to Ship: 8 Day(s) or more |
Brand |
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Product Series |
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Days to Ship |
Product Type |
Measuring Range(μm) |
Resolution(μm) |
Measurement accuracy |
You can add up to 6 items per a category to the compare list. | You can add up to 6 items per a category to the compare list. | |
Brand | A&D | KETTKAGAKU |
Product Series | ||
From | ₹ 6,088.65 | ₹ 205,318.51 |
Days to Ship | 5 Day(s) or more | 8 Day(s) or more |
Product Type | Film Thickness Gauge | Film Thickness Gauge |
Measuring Range(μm) | Pulse/echo mode: 0.8 to 200.0 ~ 7 MHz probe: 0.8 to 200.0, 5 MHz probe: 1.0 to 300.0, 2.0 to 300.0, 4.0 to 30.0 (*measured over coating) | 0~2500 |
Resolution(μm) | - | Less than 100 μm: 0.1 μm, 100 μm or more: 1 μm |
Measurement accuracy | ±0.1 mm ±0.5% (measurement range: 0.8 to 50.0 mm), ±0.1 mm ±1.5% (measurement range: 50.1 to 300.0 mm) *Measurement and corresponding precision will depend on the state of the surface of the object being measured. | - |
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