What are the operating environment conditions for probes?

Ambient temperature is 10 to 40℃, humidity is below 30%, and there is no dust, corrosive gas, oil, etc., so that the probe is not polluted.

Does the center distance chosen for the probe refer to the center distance between two adjacent probes?

Yes. If it is less than the minimum mounting pitch, the installation of two adjacent probes interferes with each other.

If I choose a non-lead type product, how to use it?

The customer shall weld the wire by himself.

Notice of End of Sales for Economy Series Pneumatic Equipment Category. More information.

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RNPA085-BB

Plunger Tip Shape (Both Ends Type) type CAD Days to Ship

Specification/Dimensions

Plunger Tip Shape (Both Ends Type)
- J1 (L) / J (R)
- J1 (L) / U (R)
- B (L) / B (R)
- B (L) / J (R)
- B (L) / U (R)
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- RNPA085
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RNPA085 Series Double Tipped Contact Probes, Min Pitch1.0mm 【50 Pieces Per Package】 (Part Number)

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MiSUMi Economy

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Economy RNPA085 Series Double Tipped Contact Probes

High Precision Durable Reliable

- Achieve accuracy with a minimal pitch, perfect for tight spaces and detailed testing.

- Nickel and gold plating ensure long-lasting performance and resistance to wear.

- Provides reliable electrical performance with robust conductivity.

- Get high-quality contact probes at a budget-friendly price.

- Suitable for various testing needs including PCB and semiconductor applications.

Economy NP20 Contact Probes: Precision and Performance at a Value

MISUMI Standard

Cheaper Price

Product Variety

3D CAD
3D CAD Support

Product Overview of Contact Probes

Overview of Contact Probes
Contact Probes is a contact medium for electrical testing, and a high-end precision electronic hardware component.
It can be used to check the conductivity of all electronic circuits.

Product Feature of Contact Probes

Types Typical Intended Use of Contact Probes
●Contact Probes	It can be widely used in printed circuit boards, packaged circuit boards, semiconductors, circuit testing, harness testing, etc. ICT and PCB2 types are available for different purposes. ICT is suitable for inspection of substrates with large strokes and various integrated circuits. PCB probe is cheaper than ICT probe and is used for inspection of individual printed substrates.
● Rotary type Contact Probes	Since the plunger rotates with the change of the stroke, the flux and the oxide protective film will be destroyed. Mainly used for open circuit and short circuit test of printed circuit board.
● Integral Contact Probes	An integral probe consisting of a pin from the tip to the end. Allows flow of stable current, regardless of stroke.
●Double tipped Contact Probes	No probe holder is needed, and it can be installed with a narrower pitch.

Dimensional Drawing of Contact Probes

Product Drawings of Contact Probes (Unit: mm)
(Economic type) Double Tipped Probe For IC test socket Boxed sales Mounting pitch 31.5mil 40mil series 0.8mm 1.0mm (50 pcs included) Dimensional drawing

(Economic type) Double Tipped Probe For IC test socket Boxed sales Mounting pitch 31.5mil 40mil series 0.8mm 1.0mm (50 pcs included) Dimensional drawing

■Selection example of Contact Probes holder tip shape pattern
(Economic type) Double Tipped Probe For IC test socket Boxed sales Mounting pitch 31.5mil 40mil series 0.8mm 1.0mm (50 pcs included) Dimensional drawing

Example Use of Contact Probes

Punching machine (automatic or manual)	Circuit board for conductivity check

Precautions of Contact Probes

■Precautions of Contact Probes
■General environmental conditions of Contact Probes
· Operating ambient temperature is 10 to 40 degrees, humidity is 30% below
· Surrounding environment: An environment where there is no dust, corrosive gas, oil, etc. so that the probe is not polluted.
■Stroke condition
· Please apply axial load only, not transverse load.
· Exceeding the specified stroke (2/3 of the full stroke) will significantly reduce the life of the probe.
· The Contact Probes life may be shortened if moving at a speed of more than 60 times /min (constant speed).
■Current application condition
· Please apply current in a static state and in contact with the target contact within the specified stroke.
· The probe life may be significantly reduced if current is applied during operation within the specified stroke, outside the specified stroke, or without contact with the target contact (open circuit).
· The probe may not meet the maximum allowable current listed in the catalog due to aging and other reasons. Please design to ensure there is enough margin in actual use.
■Voltage application condition
· Please apply voltage in a static state and in contact with the target contact within the specified stroke.
· Do not apply voltage without contact with the target contact (open circuit). Otherwise, it will cause electric discharge when it is about to be touched, causing damage to the probe.
· When applying high voltage to the probe, please strictly observe the application conditions of current and voltage, and pay attention to avoid discharge phenomenon and instantaneous huge current generated during discharge.
■Maximum allowable current
· The maximum allowable current listed in the product catalog is the maximum value of continuous current flowing within 1 minute under the above-mentioned conditions (general environment, stroke, application of current and voltage).
■Contact resistance
· The resistance value listed in the product catalog refers to the representative value measured by applying a current of 10 mA to the Contact Probes and making it contact with the pure silver terminal under the above-mentioned conditions (general environment, stroke, application of current and voltage).
· If the flowing current is too large, the resistance may increase due to the internal aging of the contact or probe.
· After repeated operations within the specified stroke, the resistance may increase due to the aging of the contact or probe.
■Reference number of replacements
· The reference number of replacements listed in the product catalog refers to the reference number for probes that can be used normally when the current is 10mA under the above conditions (general environment, stroke, application of current and voltage).
· When the resistance increases or the spring pressure decreases due to the difference in the operating environment and conditions, the probe may need to be replaced before the reference number is reached. Please replace it in time according to actual usage.
■Spring pressure
· If the Contact Probes temperature exceeds 80 ℃, the spring pressure will drop.
· If the current value is increased, the spring pressure may drop due to the heating of the probe.
■Mounting hole size for press-fit (reference)
· Reference value only, depending on the material and thickness of the resin plate. Please design referring to the size of the probe holder press-fit part.

Usage Method of Contact Probes

●Selection of Contact Probes (probe holder)
Please select the product according to the mounting pitch (spacing) of the workpiece to be inspected.
Also, select the probe holder corresponding to the probe.
＊ The probe is different from the probe holder mounted directly on the resin plate, can be easily disassembled, saving time to replace the probe.
●About the use of the Contact Probes (probe holder)
① Insert the probe holder after opening holes on the resin plate (bakelite board, etc.). (See Diagram 1)
* For the opening size, please refer to the mounting hole size for press-fit as documented on each page. (See Diagram 2)
* If there is clearance between the resin plate and the probe holder, please fix it with adhesive before using it.
② After installation, wire to the probe holder.
＊ When soldering wires, please be careful not to let the flux flow into the probe holder. Otherwise, the probe may not work.
＊ Depending on the environment, if there is no space for soldering or wiring, please perform wiring before press-fit.
③ Insert the Contact Probes into the probe holder. (Refer to Diagram 1)
* At this time, if the tip (plunger) part is pressed down forcefully, it may cause damage or deterioration in function. Please be careful.
＊ Please use within the prescribed stroke (2/3 of the full stroke).

(Economic type) Double Tipped Probe (for IC test socket) Boxed sales Mounting pitch 31.5mil 40mil series 0.8mm 1.0mm (50 pcs included) Usage method

Related Products of Contact Probes

MISUMI Contact Probes NP45HD series matching probe holder product NR45/NR45T
(Economic type) Double Tipped Probe (for IC test socket) Boxed sales Mounting pitch 31.5mil 40mil series 0.8mm 1.0mm (50 pcs included) Related products

(Economic type) Double Tipped Probe (for IC test socket) Boxed sales Mounting pitch 31.5mil 40mil series 0.8mm 1.0mm (50 pcs included) Related products

Specification Table of Contact Probes

Part Number of Contact Probes		Tip Shape of Contact Probes		Mounting Pitch (min)	Full stroke (Rated stroke)	Spring pressure (Rated stroke)	Maximum Allowable Current	Resistance	Reference of replacement number of use
Type	No.	L (Left)	R (Right)
RNPA	085	B	U J B	40mil/1.0mm	1.1mm (0.65mm)	31±6gf	5A	50mΩ	100,000 times
		J1	U J

Part Number

Incomplete part number.
Please use left hand selections to complete a part number.

: 30; 60; 90

Part Number
RNPA085-BB
RNPA085-BJ
RNPA085-BU
RNPA085-J1J
RNPA085-J1U

Price	Minimum Order Qty.	Number of pc(s). included in pkg.	Volume Discount	Days to Ship	Plunger Tip Shape (Both Ends Type)
₹ 3,560.80	1 Pack(s)	50 Pieces Per Package	Available	10 Day(s)	B (L) / B (R)
₹ 3,567.85	1 Pack(s)	50 Pieces Per Package	Available	10 Day(s)	B (L) / J (R)
₹ 3,566.44	1 Pack(s)	50 Pieces Per Package	Available	10 Day(s)	B (L) / U (R)
₹ 3,566.44	1 Pack(s)	50 Pieces Per Package	Available	10 Day(s)	J1 (L) / J (R)
₹ 3,567.85	1 Pack(s)	50 Pieces Per Package	Available	10 Day(s)	J1 (L) / U (R)

Days to Ship

【Economic type】Double Tipped Probe (for IC test socket) Boxed sales Mounting pitch 31.5mil·40mil series (0.8mm·1.0mm): Related image

Product TOP

Basic Information

Type	Double Tipped Probe	Min. Mounting Pitch(mm)	1	Full Stroke (Range)(mm)	1~2.6
Full Stroke(mm)	1.1	2/3 Stroke Spring Pressure (Range)(gf)	30.1~50	Plunger Material	BeCu
Plunger O.D.(Ø)	0.5	Plunger Surface Treatment	Nickel Plating Base, Gold Plating	Plunger Length L1 (Range)(mm)	0.1~3
Barrel, Receptacle Material	Phosphor Bronze	Barrel, Receptacle O.D.(Ø)	0.85	Properties	Standard
Allowable Current(A)	5	Resistance(mΩ)	50	Plunger Length(mm)	0.6 (L) / 1.1 (R)
Barrel, Receptacle Length(mm)	4	2/3 Stroke Spring Pressure(gf)	31

The specifications and dimensions of some parts may not be fully covered. For exact details, refer to manufacturer catalogs .

Frequently asked question (FAQ)

Question: What are the operating environment conditions for probes?: Answer: Ambient temperature is 10 to 40℃, humidity is below 30%, and there is no dust, corrosive gas, oil, etc., so that the probe is not polluted.
Question: Does the center distance chosen for the probe refer to the center distance between two adjacent probes?: Answer: Yes. If it is less than the minimum mounting pitch, the installation of two adjacent probes interferes with each other.
Question: If I choose a non-lead type product, how to use it?: Answer: The customer shall weld the wire by himself.

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