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MISUMI India offices and warehouses will remain closed on 26th January 2026 on account of Republic Day.

View all Economy Contact Probes

Economy Contact Probe

A total of 8 series
150 standard new product launch

Excellent durability

High electrical conductivity achieved through head plating

Product Features

Comparison of specifications and performance between Misumi products and market distributed products*

Item	MISUMI existing products	MISUMI Economy Type	Market distribution product*
Subject matter	Brass	Phosphor bronze	Copper nickel alloy
Head surface treatment	Rhodium plating	Gold plating	Nickel plating
Service life	300,000 times	100,000 times	50,000 to 80,000 times

Wear resistance comparison

Probe head durability test of 100,000 times

Misumi Economy Type

Slight wear occurs

Market distribution products

Severe wear and tear

Load and electrical conductivity comparison

Misumi's rhodium-plated and gold-plated products show no significant change in load and resistance values even after 200,000 uses.

Misumi products have excellent electrical conductivity and very stable resistance values compared to nickel plating on the market due to gold plating.

Durability test	Initial value	10,000 times	50,000 times	100,000 times	200,000 times
Rhodium Plating	1,873	1,890	1,898	1,908	1.957
Gold plating	1,936	2.043	2.083	2.044	1.986

Load Measurement Results

Resistance value (average)

Unit: MQ

Durability test	Initial value	10,000 times	50,000 times	100,000 times	200,000 times
Rhodium plating	37.92	51.91	50.34	66.70	55.65
Gold plating	29.53	31.14	30.40	31.95	33.61

Resistance value measurement result

※ Market distribution products are similar products that we purchase at random from online and offline markets.

※ The experimental data is obtained through our own inspection measurements and is provided for reference only.

ICT Test Probe

Test probes are widely used in the testing field of semiconductors (ICs) and printed circuit boards (PCBs), and the probes are mounted inside a socket or jig. The socket or jig is mounted between the object to be measured and the test board, and the probe is connected to the object to be measured and the test board, transmitting a constant current and frequency to determine whether the object to be measured passes or fails

Use Case

How to use

IC Test probe

Spring probes are used to test the performance of semiconductor ICs. The upper head of the probe contacts the IC measurement point (PAD, BALL, etc.) and the lower pin contacts the measurement board to transmit a constant current and frequency to determine whether the measurement object is qualified.

Probe for printed circuit board (PCB) inspection

Printed circuit board (PCB) probes are generally assembled with bushes and used to test the continuity of circuit boards. They are also used to test actual boards (ICT/FCT) with components connected.