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Probe-Type Electrical Characteristics Inspection Device
Specifications and Features
- Purpose/Function
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Inspection/Measurement
Moves workpieces supplied by a robot onto two workpiece tables and positions the probe holder for inspection.
Widely applied to conduction tests and line tests of electronic circuits in the semiconductor industry.
Widely applied to conduction tests and line tests of electronic circuits in the semiconductor industry.
※ This example is for design reference only. Equipment components may differ from the actual shape.
| No. | Component | Economy Type Number | Specification | Quantity | Unit Price |
|---|---|---|---|---|---|
| ① | Angle Plate | C-AIKK200-100 | Height: 200mm Length: 60mm |
1 | ₹ 4804/Piece |
| ② | Proximity Sensor | C-2C08-N11 | Output type: NPN (normally open) Detection distance: 4.0mm Sensor head specification: M8×1.0mm |
2 | ₹ 1917/Piece |
| ③ | Contact Probe | C-NP58-C | Probe head shape: A type Probe head outer diameter: 0.8mm |
2 | ₹ 2449.30/Piece |
| ④ | Actuator | C-KS4001-B1-100-F0 | Cover: None Base length: 100mm Stage long block: 1 piece Motor accessory: F0 |
1 | ₹ 22,111/Piece |
※ GST is excluded in these prices, and the specific details are based on the website quote.
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※ The price on the product list is the starting price for that product.
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